The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

Published 2013 View Full Article

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Title
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 24, Issue 22, Pages 225701
Publisher
IOP Publishing
Online
2013-05-01
DOI
10.1088/0957-4484/24/22/225701

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