Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

Published 2008 View Full Article

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Title
Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 78, Issue 3, Pages -
Publisher
American Physical Society (APS)
Online
2008-07-08
DOI
10.1103/physrevb.78.035410

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