Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Large area strain analysis using scanning transmission electron microscopy across multiple images

(2015) A. A. Oni et al.   APPLIED PHYSICS LETTERS

Nanoscale strain distributions in embedded SiGe semiconductor devices revealed by precession electron diffraction and dual lens dark field electron holography

(2015) D. Cooper et al.   APPLIED PHYSICS LETTERS

Diffraction contrast imaging using virtual apertures

(2015) Christoph Gammer et al.   ULTRAMICROSCOPY

Effect of crystal quality on performance of spin-polarized photocathode

(2014) Xiuguang Jin et al.   APPLIED PHYSICS LETTERS

Observing and measuring strain in nanostructures and devices with transmission electron microscopy

(2014) Martin J. Hÿtch et al.   MRS BULLETIN

Elastic strain engineering for unprecedented materials properties

(2014) Ju Li et al.   MRS BULLETIN

Interface lattice displacement measurement to 1pm by geometric phase analysis on aberration-corrected HAADF STEM images

(2013) Yuanyuan Zhu et al.   ACTA MATERIALIA

High-Performance Spin-Polarized Photocathodes Using a GaAs/GaAsP Strain-Compensated Superlattice

(2013) Xiuguang Jin et al.   Applied Physics Express

Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy

(2012) David Cooper et al.   APPLIED PHYSICS LETTERS

Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

(2012) Knut Müller et al.   APPLIED PHYSICS LETTERS

Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy

(2012) Knut Müller et al.   MICROSCOPY AND MICROANALYSIS

An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices

(2010) Christoph T. Koch et al.   APPLIED PHYSICS LETTERS

Strain: A Solution for Higher Carrier Mobility in Nanoscale MOSFETs

(2009) Min Chu et al.   Annual Review of Materials Research

Direct Imaging of Nanoscale Phase Separation inLa0.55Ca0.45MnO3: Relationship to Colossal Magnetoresistance

(2009) J. Tao et al.   PHYSICAL REVIEW LETTERS

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

(2009) Rolf Erni et al.   PHYSICAL REVIEW LETTERS

Position averaged convergent beam electron diffraction: Theory and applications

(2009) James M. LeBeau et al.   ULTRAMICROSCOPY

Nanoscale holographic interferometry for strain measurements in electronic devices

(2008) Martin Hÿtch et al.   NATURE

The “state of the art” of the diffraction analysis of crystallite size and lattice strain

(2008) Eric J. Mittemeijer et al.   ZEITSCHRIFT FUR KRISTALLOGRAPHIE