Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device

Direct electron detection yields cryo-EM reconstructions at resolutions beyond 3/4 Nyquist frequency

(2012) Benjamin E. Bammes et al.   JOURNAL OF STRUCTURAL BIOLOGY

Beam-induced motion of vitrified specimen on holey carbon film

(2012) Axel F. Brilot et al.   JOURNAL OF STRUCTURAL BIOLOGY

Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy

(2012) Knut Müller et al.   MICROSCOPY AND MICROANALYSIS

Initial evaluation of a direct detection device detector for single particle cryo-electron microscopy

(2011) Anna-Clare Milazzo et al.   JOURNAL OF STRUCTURAL BIOLOGY

A new pnCCD-based color X-ray camera for fast spatial and energy-resolved measurements

(2011) I. Ordavo et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Atomic scale annealing effects on InxGa1−xNyAs1−ystudied by TEM three-beam imaging

(2011) Knut Müller et al.   PHYSICAL REVIEW B

An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices

(2010) Christoph T. Koch et al.   APPLIED PHYSICS LETTERS

Characterization of a direct detection device imaging camera for transmission electron microscopy

(2010) Anna-Clare Milazzo et al.   ULTRAMICROSCOPY

Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography

(2009) Florian Hüe et al.   APPLIED PHYSICS LETTERS

Improved precision in strain measurement using nanobeam electron diffraction

(2009) A. Béché et al.   APPLIED PHYSICS LETTERS

Displacement field measurement of metal sub-lattice in inversion domains of indium-doped zinc oxide

(2009) Wentao Yu et al.   ULTRAMICROSCOPY

Nanoscale holographic interferometry for strain measurements in electronic devices

(2008) Martin Hÿtch et al.   NATURE

Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

(2008) Florian Hüe et al.   PHYSICAL REVIEW LETTERS

Applications of direct detection device in transmission electron microscopy

(2007) Liang Jin et al.   JOURNAL OF STRUCTURAL BIOLOGY