Large area strain analysis using scanning transmission electron microscopy across multiple images

Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation

(2014) Xiahan Sang et al.   MICROSCOPY AND MICROANALYSIS

Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge

(2014) Xiahan Sang et al.   ULTRAMICROSCOPY

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

(2013) A. Béché et al.   ULTRAMICROSCOPY

A Methodology for Determination of γ′ Site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-ray Diffraction

(2012) Jaimie S. Tiley et al.   METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE

Position averaged convergent beam electron diffraction: Theory and applications

(2009) James M. LeBeau et al.   ULTRAMICROSCOPY

Chromium and tantalum site substitution patterns in Ni3Al(L12) γ′-precipitates

(2008) Christopher Booth-Morrison et al.   APPLIED PHYSICS LETTERS