Nanoscale holographic interferometry for strain measurements in electronic devices

Published 2008 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Nanoscale holographic interferometry for strain measurements in electronic devices
Authors
Keywords
-
Journal
NATURE
Volume 453, Issue 7198, Pages 1086-1089
Publisher
Springer Nature
Online
2008-06-19
DOI
10.1038/nature07049

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.