The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors

Published 2010 View Full Article

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Title
The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors
Authors
Keywords
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Journal
ELECTROCHEMICAL AND SOLID STATE LETTERS
Volume 13, Issue 6, Pages H213
Publisher
The Electrochemical Society
Online
2010-04-14
DOI
10.1149/1.3381023
References
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