Power- and Low-Resistance-State-Dependent, Bipolar Reset-Switching Transitions in SiN-Based Resistive Random-Access Memory

标题
Power- and Low-Resistance-State-Dependent, Bipolar Reset-Switching Transitions in SiN-Based Resistive Random-Access Memory
作者
关键词
Conducting Path, Current Compliance, Space Charge Limited Current, Reset Process, Crossbar Array
出版物
Nanoscale Research Letters
Volume 11, Issue 1, Pages -
出版商
Springer Nature
发表日期
2016-08-12
DOI
10.1186/s11671-016-1572-9

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