In Situ Observation of Compliance-Current Overshoot and Its Effect on Resistive Switching

出版年份 2010 全文链接

标题

作者

关键词

出版物

Volume 31, Issue 3, Pages 246-248

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2010-02-16

DOI

10.1109/led.2009.2039694

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