Low-power electronic technologies for harsh radiation environments

Memristive crossbar arrays for brain-inspired computing

(2019) Qiangfei Xia et al.   NATURE MATERIALS

Bioinspired Artificial Sensory Nerve Based on Nafion Memristor

(2019) Chen Zhang et al.   ADVANCED FUNCTIONAL MATERIALS

Flexible Hybrid Sensors for Health Monitoring: Materials and Mechanisms to Render Wearability

(2019) Yuji Gao et al.   ADVANCED MATERIALS

Gasistor: A memristor based gas-triggered switch and gas sensor with memory

(2019) Marek Vidiš et al.   APPLIED PHYSICS LETTERS

Soft eSkin: distributed touch sensing with harmonized energy and computing

(2019) Mahesh Soni et al.   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

Total Ionizing Dose Hardened and Mitigation Strategies in Deep Submicrometer CMOS and Beyond

(2018) Eleni Chatzikyriakou et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

(2018) Dakai Chen et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash Memories

(2018) M. Bagatin et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs

(2018) M. Raine et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Influence of LDD Spacers and H+ Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh Doses

(2018) Federico Faccio et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

K-means Data Clustering with Memristor Networks

(2018) YeonJoo Jeong et al.   NANO LETTERS

A radiation-hardening Ta/Ta2O5-x/Al2O3/InGaZnO4 memristor for harsh electronics

(2018) Jingjuan Wang et al.   APPLIED PHYSICS LETTERS

An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18- $\mu$ m CMOS Technology

(2018) Jeffrey Prinzie et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Evaluation of Radiation Effects in RRAM-Based Neuromorphic Computing System for Inference

(2018) Zhilu Ye et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

(2017) Rui Liu et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Single-Event Multiple Transients in Conventional and Guard-Ring Hardened Inverter Chains Under Pulsed Laser and Heavy-Ion Irradiation

(2017) Rongmei Chen et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

(2017) M. P. King et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground

(2017) Kazuyuki Hirose et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Spintronics based random access memory: a review

(2017) Sabpreet Bhatti et al.   Materials Today

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

(2017) T.S. Nidhin et al.   Nuclear Engineering and Technology

Effect of gamma irradiation on resistive switching of Al/TiO 2 /n + Si ReRAM

(2017) Kirti Agashe et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Review of radiation effects on ReRAM devices and technology

(2017) Yago Gonzalez-Velo et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Energetic Particle Data From the Global Positioning System Constellation

(2017) S. K. Morley et al.   SPACE WEATHER-THE INTERNATIONAL JOURNAL OF RESEARCH AND APPLICATIONS

Multibit memory operation of metal-oxide bi-layer memristors

(2017) Spyros Stathopoulos et al.   Scientific Reports

Heavy Ion Characterization of Temporal-, Dual- and Triple Redundant Flip-Flops Across a Wide Supply Voltage Range in a 65 nm Bulk CMOS Process

(2016) Amir Hasanbegovic et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

A Comparison of the SEU Response of Planar and FinFET D Flip-Flops at Advanced Technology Nodes

(2016) Patrick Nsengiyumva et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Label-Free Ultrasensitive Memristive Aptasensor

(2016) Ioulia Tzouvadaki et al.   NANO LETTERS

Unsupervised learning in probabilistic neural networks with multi-state metal-oxide memristive synapses

(2016) Alexander Serb et al.   Nature Communications

High Density Crossbar Arrays with Sub- 15 nm Single Cells via Liftoff Process Only

(2016) Ali Khiat et al.   Scientific Reports

Plasma conditions at Europa’s orbit

(2015) Fran Bagenal et al.   ICARUS

Investigation of Single-Bit and Multiple-Bit Upsets in Oxide RRAM-Based 1T1R and Crossbar Memory Arrays

(2015) Rui Liu et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Multi-Cell Soft Errors at Advanced Technology Nodes

(2015) B. L. Bhuva et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs

(2015) F. Faccio et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Radiation effects on the magnetism and the spin dependent transport in magnetic materials and nanostructures for spintronic applications

(2015) Jiwei Lu et al.   JOURNAL OF MATERIALS RESEARCH

Total ionizing dose effect of γ-ray radiation on the switching characteristics and filament stability of HfOx resistive random access memory

(2014) Runchen Fang et al.   APPLIED PHYSICS LETTERS

Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

(2014) Daniel Gomez Toro et al.   IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies

(2014) M. Gaillardin et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Total Ionizing Dose Tolerance of ${\rm Ag} - {\rm Ge}_{40}{\rm S}_{60}$ based Programmable Metallization Cells

(2014) P. Dandamudi et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Emerging memories

(2014) Livio Baldi et al.   SOLID-STATE ELECTRONICS

Review on Non-Volatile Memory with High-k Dielectrics: Flash for Generation Beyond 32 nm

(2014) Chun Zhao et al.   Materials

Total ionizing dose (TID) effects of γ ray radiation on switching behaviors of Ag/AlOx/Pt RRAM device

(2014) Fang Yuan et al.   Nanoscale Research Letters

A Versatile Light-Switchable Nanorod Memory: Wurtzite ZnO on Perovskite SrTiO3

(2013) Ashok Bera et al.   ADVANCED FUNCTIONAL MATERIALS

Nanometer-Scale ${\rm HfO}_{x}$ RRAM

(2013) Zhiping Zhang et al.   IEEE ELECTRON DEVICE LETTERS

Impact of SOI Substrate on the Radiation Response of UltraThin Transistors Down to the 20 nm Node

(2013) Marc Gaillardin et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Displacement Damage Effects in Irradiated Semiconductor Devices

(2013) J. R. Srour et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

(2013) Eddy Simoen et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Nanobatteries in redox-based resistive switches require extension of memristor theory

(2013) I. Valov et al.   Nature Communications

Assessment of the Impact of Cosmic-Ray-Induced Neutrons on Hardware in the Roadrunner Supercomputer

(2012) Sarah E. Michalak et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

(2012) N. Seifert et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Total Ionizing Dose (TID) Effects on $\hbox{TaO}_{x}$ -Based Resistance Change Memory

(2011) Lijie Zhang et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques

(2011) Alfio Zanchi et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Impact of Alpha Particles on the Electrical Characteristics of TiO$_{2}$ Memristors

(2011) H. J. Barnaby et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Influence of Back-Gate Bias and Process Conditions on the Gamma Degradation of the Transconductance of MuGFETs

(2010) Sofie Put et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Use of Laser to Explain Heavy Ion Induced SEFIs in SDRAMs

(2010) A. Bougerol et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Quantifying the Effect of Guard Rings and Guard Drains in Mitigating Charge Collection and Charge Spread

(2009) Balaji Narasimham et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS

(2009) D. G. Mavis et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology

(2008) Ronald C. Lacoe   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Radiation Effects in MOS Oxides

(2008) James R. Schwank et al.   IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Radiation hardening by design

(2008) J. W. Gambles et al.   INTERNATIONAL JOURNAL OF ELECTRONICS

Memristive switching mechanism for metal/oxide/metal nanodevices

(2008) J. Joshua Yang et al.   Nature Nanotechnology