Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants
Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants
作者
关键词
Configuration Memory, Fault Tolerance, FPGAs, Nuclear Power Plant I&C Systems, Radiation Effects, Single Event Effects, Single Event Upset, SEU Mitigation, Soft Errors, TID Effects
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