Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

标题
Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology
作者
关键词
-
出版物
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 64, Issue 1, Pages 113-118
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2016-11-10
DOI
10.1109/tns.2016.2627015

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