Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

出版年份 2018 全文链接

标题

作者

关键词

出版物

Volume 65, Issue 1, Pages 19-26

出版商

Institute of Electrical and Electronics Engineers (IEEE)

发表日期

2017-10-21

DOI

10.1109/tns.2017.2764852

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