Role of oxygen vacancies on the bias illumination stress stability of solution-processed zinc tin oxide thin film transistors

Impact of Soft Annealing on the Performance of Solution-Processed Amorphous Zinc Tin Oxide Thin-Film Transistors

(2013) Pradipta K. Nayak et al.   ACS Applied Materials & Interfaces

UV-Visible Spectroscopic Analysis of Electrical Properties in Alkali Metal-Doped Amorphous Zinc Tin Oxide Thin-Film Transistors

(2013) Keon-Hee Lim et al.   ADVANCED MATERIALS

Defect reduction in photon-accelerated negative bias instability of InGaZnO thin-film transistors by high-pressure water vapor annealing

(2013) You Seung Rim et al.   APPLIED PHYSICS LETTERS

Photo stability of solution-processed low-voltage high mobility zinc-tin-oxide/ZrO2 thin-film transistors for transparent display applications

(2013) Tae-Jun Ha et al.   APPLIED PHYSICS LETTERS

Mechanism of positive bias stress-assisted recovery in amorphous-indium-gallium-zinc-oxide thin-film transistors from negative bias under illumination stress

(2013) Jae Gwang Um et al.   APPLIED PHYSICS LETTERS

Low-Temperature, Solution-Processed Zinc Tin Oxide Thin-Film Transistors Fabricated by Thermal Annealing and Microwave Irradiation

(2013) Young Bum Yoo et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Fringe Field Effect on Electrical Characteristics of Pentacene Thin-Film Transistors

(2013) Jaehoon Park et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Effects of O2plasma treatment on low temperature solution-processed zinc tin oxide thin film transistors

(2013) Jeong-Soo Lee et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Variation of Oxygen Deficiency in Solution-Processed Ultra-Thin Zinc-Tin Oxide Films to Their Transistor Characteristics

(2013) Li-Chih Liu et al.   ECS Journal of Solid State Science and Technology

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Role of Adsorbed H$_{2}$O on Transfer Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

(2012) DooHyun Kim et al.   Applied Physics Express

Atomic layer deposited zinc tin oxide channel for amorphous oxide thin film transistors

(2012) Jaeyeong Heo et al.   APPLIED PHYSICS LETTERS

Carrier-Suppressing Effect of Mg in Solution-Processed Zn-Sn-O Thin-Film Transistors

(2012) Hyun Soo Lim et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Solution-Processed Zinc Oxide Thin-Film Transistors With a Low-Temperature Polymer Passivation Layer

(2012) Xiaoli Xu et al.   IEEE ELECTRON DEVICE LETTERS

Improvement of the photo-bias stability of the Zn–Sn–O field effect transistors by an ozone treatment

(2012) Bong Seob Yang et al.   JOURNAL OF MATERIALS CHEMISTRY

Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

(2011) Sheng-Yao Huang et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Effect of Zinc/Tin Composition Ratio on the Operational Stability of Solution-Processed Zinc–Tin–Oxide Thin-Film Transistors

(2011) Yong-Hoon Kim et al.   IEEE ELECTRON DEVICE LETTERS

Low-temperature fabrication of high-performance metal oxide thin-film electronics via combustion processing

(2011) Myung-Gil Kim et al.   NATURE MATERIALS

Unusual enhancement in electrical conductivity of tin oxide thin films with zinc doping

(2011) Yinzhu Jiang et al.   PHYSICAL CHEMISTRY CHEMICAL PHYSICS

Improvement in the photon-induced bias stability of Al–Sn–Zn–In–O thin film transistors by adopting AlOx passivation layer

(2010) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

(2010) Himchan Oh et al.   APPLIED PHYSICS LETTERS

Light induced instabilities in amorphous indium–gallium–zinc–oxide thin-film transistors

(2010) Md Delwar Hossain Chowdhury et al.   APPLIED PHYSICS LETTERS

Postannealing Process for Low Temperature Processed Sol–Gel Zinc Tin Oxide Thin Film Transistors

(2010) Seok-Jun Seo et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

(2010) John F. Conley   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY