Improvement of the photo-bias stability of the Zn–Sn–O field effect transistors by an ozone treatment

Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness

(2012) Yoon Jang Chung et al.   JOURNAL OF APPLIED PHYSICS

Role of ZrO2 incorporation in the suppression of negative bias illumination-induced instability in Zn–Sn–O thin film transistors

(2011) Bong Seob Yang et al.   APPLIED PHYSICS LETTERS

Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment

(2011) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination

(2011) Jeong Hwan Kim et al.   APPLIED PHYSICS LETTERS

Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors

(2011) Kwang Hwan Ji et al.   APPLIED PHYSICS LETTERS

Solution-processable tin-doped indium oxide with a versatile patternability for transparent oxide thin film transistors

(2011) Keunkyu Song et al.   JOURNAL OF MATERIALS CHEMISTRY

Hybrid complementary metal-oxide-semiconductor inverters based on single nanowires

(2011) Yu Dai et al.   JOURNAL OF MATERIALS CHEMISTRY

High-performance solution processed oxide TFT with aluminum oxide gate dielectric fabricated by a sol–gel method

(2011) Christophe Avis et al.   JOURNAL OF MATERIALS CHEMISTRY

Improvement in the negative bias illumination temperature stress instability of In-Ga-Zn-O thin film transistors using an Al2O3 buffer layer

(2011) Jeong Hwan Kim et al.   Physica Status Solidi-Rapid Research Letters

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

(2010) Himchan Oh et al.   APPLIED PHYSICS LETTERS

Light induced instabilities in amorphous indium–gallium–zinc–oxide thin-film transistors

(2010) Md Delwar Hossain Chowdhury et al.   APPLIED PHYSICS LETTERS

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

(2010) Kwang Hwan Ji et al.   IEEE ELECTRON DEVICE LETTERS

High-Performance Solution-Processed Amorphous Zinc−Indium−Tin Oxide Thin-Film Transistors

(2010) Myung-Gil Kim et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Impact of Sn/Zn ratio on the gate bias and temperature-induced instability of Zn-In-Sn-O thin film transistors

(2009) Min Ki Ryu et al.   APPLIED PHYSICS LETTERS

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

12.1-in. WXGA AMOLED display driven by InGaZnO thin-film transistors

(2009) Jae Kyeong Jeong et al.   Journal of the Society for Information Display

Bulk-Limited Current Conduction in Amorphous InGaZnO Thin Films

(2008) Hyun-Joong Chung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Oxygen influence on the interaction mechanisms of ozone on SnO2 sensors

(2007) L. Berry et al.   SENSORS AND ACTUATORS B-CHEMICAL