Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study

Published 2011 View Full Article

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Title
Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 7, Pages 1995-2002
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-05-10
DOI
10.1109/ted.2011.2138143

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