Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor

Published 2011 View Full Article

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Title
Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 4, Pages 1127-1133
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-03-08
DOI
10.1109/ted.2011.2109388

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