Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors

The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

(2012) Sheng-Yao Huang et al.   APPLIED PHYSICS LETTERS

Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors

(2012) Sheng-Yao Huang et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors

(2012) Geng-Wei Chang et al.   IEEE ELECTRON DEVICE LETTERS

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

(2011) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

H2O-Assisted O2 Adsorption in Sol-Gel Derived Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

(2011) Wan-Fang Chung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

(2010) Chih-Tsung Tsai et al.   APPLIED PHYSICS LETTERS

Temperature Dependence of Transistor Characteristics and Electronic Structure for Amorphous In–Ga–Zn-Oxide Thin Film Transistor

(2010) Hiromichi Godo et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Improvement in the bias stability of amorphous indium gallium zinc oxide thin-film transistors using an O2 plasma-treated insulator

(2009) Yeon-Keon Moon et al.   APPLIED PHYSICS LETTERS

Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs

(2009) Chia-Sheng Lin et al.   IEEE ELECTRON DEVICE LETTERS