Band alignment of AlN/β-Ga2O3 heterojunction interface measured by x-ray photoelectron spectroscopy
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Title
Band alignment of AlN/β-Ga2O3 heterojunction interface measured by x-ray photoelectron spectroscopy
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 112, Issue 26, Pages 261602
Publisher
AIP Publishing
Online
2018-06-25
DOI
10.1063/1.5035372
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