Spectroscopic and electrical calculation of band alignment between atomic layer deposited SiO2 and β-Ga2O3 ( 2¯01)

Title
Spectroscopic and electrical calculation of band alignment between atomic layer deposited SiO2 and β-Ga2O3 ( 2¯01)
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 10, Pages 102107
Publisher
AIP Publishing
Online
2015-03-14
DOI
10.1063/1.4915262

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