Field‐Induced Ferroelectric Phase Evolution During Polarization “Wake‐Up” in Hf0.5Zr0.5O2 Thin Film Capacitors
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Title
Field‐Induced Ferroelectric Phase Evolution During Polarization “Wake‐Up” in Hf0.5Zr0.5O2 Thin Film Capacitors
Authors
Keywords
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Journal
Advanced Electronic Materials
Volume 9, Issue 6, Pages -
Publisher
Wiley
Online
2023-04-20
DOI
10.1002/aelm.202300016
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- (2022) Uwe Schroeder et al. Nature Reviews Materials
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- (2022) Zhouchangwan Yu et al. ACS Applied Materials & Interfaces
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- (2021) Sean R. C. McMitchell et al. APPLIED PHYSICS LETTERS
- Ferroelectric and Dielectric Properties of Hf 0.5 Zr 0.5 O 2 Thin Film Near Morphotropic Phase Boundary
- (2021) Alireza Kashir et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
- Evidence of ferroelectric HfO2 phase transformation induced by electric field cycling observed at a macroscopic scale
- (2021) Siri Nittayakasetwat et al. SOLID-STATE ELECTRONICS
- Phase-Exchange-Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films
- (2020) Shelby S. Fields et al. ACS Applied Materials & Interfaces
- Compositional dependence of crystallization temperatures and phase evolution in hafnia-zirconia (HfxZr1−x)O2 thin films
- (2020) H. Alex Hsain et al. APPLIED PHYSICS LETTERS
- The Past, the Present, and the Future of Ferroelectric Memories
- (2020) T. Mikolajick et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Paraelectric/antiferroelectric/ferroelectric phase transformation in As-deposited ZrO2 thin films by the TiN capping engineering
- (2020) Chun-Yuan Wang et al. MATERIALS & DESIGN
- The future of ferroelectric field-effect transistor technology
- (2020) Asif Islam Khan et al. Nature Electronics
- Wake‐Up Effect in HfO 2 ‐Based Ferroelectric Films
- (2020) Pengfei Jiang et al. Advanced Electronic Materials
- Piezoresponse force microscopy and nanoferroic phenomena
- (2019) Alexei Gruverman et al. Nature Communications
- Review and perspective on ferroelectric HfO2-based thin films for memory applications
- (2018) Min Hyuk Park et al. MRS Communications
- Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale
- (2017) Rama K. Vasudevan et al. Applied Physics Reviews
- Physical Mechanisms behind the Field-Cycling Behavior of HfO2 -Based Ferroelectric Capacitors
- (2016) Milan Pešić et al. ADVANCED FUNCTIONAL MATERIALS
- A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2films by pulse-switching measurement
- (2016) Han Joon Kim et al. Nanoscale
- Structural Changes Underlying Field-Cycling Phenomena in Ferroelectric HfO2Thin Films
- (2016) Everett D. Grimley et al. Advanced Electronic Materials
- Complex Internal Bias Fields in Ferroelectric Hafnium Oxide
- (2015) Tony Schenk et al. ACS Applied Materials & Interfaces
- Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy
- (2015) Nina Balke et al. ACS Nano
- Pathways towards ferroelectricity in hafnia
- (2014) Tran Doan Huan et al. PHYSICAL REVIEW B
- Wake-up effects in Si-doped hafnium oxide ferroelectric thin films
- (2013) Dayu Zhou et al. APPLIED PHYSICS LETTERS
- Ferroelectricity in Simple Binary ZrO2 and HfO2
- (2012) Johannes Müller et al. NANO LETTERS
- Ferroelectricity in hafnium oxide thin films
- (2011) T. S. Böscke et al. APPLIED PHYSICS LETTERS
- Ferroelectric Zr0.5Hf0.5O2thin films for nonvolatile memory applications
- (2011) J. Müller et al. APPLIED PHYSICS LETTERS
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