The effect of ITO and Mo electrodes on the properties and stability of In-Ga-Zn-O thin film transistors

Comparative study of source-drain contact metals for amorphous InGaZnO thin-film transistors

(2014) Manoj Nag et al.   Journal of the Society for Information Display

Impact of Annealing on Contact Formation and Stability of IGZO TFTs

(2014) T. Mudgal et al.   ECS Journal of Solid State Science and Technology

Analysis of amorphous indium-gallium-zinc-oxide thin-film transistor contact metal using Pilling-Bedworth theory and a variable capacitance diode model

(2013) Ahmed Kiani et al.   APPLIED PHYSICS LETTERS

Correlation between Ti source/drain contact and performance of InGaZnO-based thin film transistors

(2013) Kwang-Hyuk Choi et al.   APPLIED PHYSICS LETTERS

Thin Film Transistor Using Amorphous InGaZnO Films as Both Channel and Source/Drain Electrodes

(2013) Kyung Park et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Overview of electroceramic materials for oxide semiconductor thin film transistors

(2013) Jin-Seong Park et al.   JOURNAL OF ELECTROCERAMICS

Bias-stability improvement using Al2O3 interfacial dielectrics in a-InSnZnO thin-film transistors

(2013) Kyungsoo Jang et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays

(2012) Sanghun Jeon et al.   NATURE MATERIALS

Instability of amorphous oxide semiconductors via carrier-mediated structural transition between disorder and peroxide state

(2012) Ho-Hyun Nahm et al.   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

(2011) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Instability of an Amorphous Indium Gallium Zinc Oxide TFT under Bias and Light Illumination

(2011) Jae-Hong Jeon et al.   JOURNAL OF THE KOREAN PHYSICAL SOCIETY

Review of recent developments in amorphous oxide semiconductor thin-film transistor devices

(2011) Joon Seok Park et al.   THIN SOLID FILMS

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress

(2010) Khashayar Ghaffarzadeh et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Temporal Anti-aliasing of a Stereoscopic 3D Video

(2009) Wook-Joong Kim et al.   ETRI JOURNAL

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

(2009) Tze-Ching Fung et al.   JOURNAL OF APPLIED PHYSICS

Gallium–Indium–Zinc-Oxide-Based Thin-Film Transistors: Influence of the Source/Drain Material

(2008) Pedro Barquinha et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES