Analysis of amorphous indium-gallium-zinc-oxide thin-film transistor contact metal using Pilling-Bedworth theory and a variable capacitance diode model

Title
Analysis of amorphous indium-gallium-zinc-oxide thin-film transistor contact metal using Pilling-Bedworth theory and a variable capacitance diode model
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 15, Pages 152102
Publisher
AIP Publishing
Online
2013-04-16
DOI
10.1063/1.4801991

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