Defect Structure Determination of GaN Films in GaN/AlN/Si Heterostructures by HR-TEM, XRD, and Slow Positrons Experiments
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Title
Defect Structure Determination of GaN Films in GaN/AlN/Si Heterostructures by HR-TEM, XRD, and Slow Positrons Experiments
Authors
Keywords
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Journal
Nanomaterials
Volume 10, Issue 2, Pages 197
Publisher
MDPI AG
Online
2020-01-23
DOI
10.3390/nano10020197
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