Defect characterization in Mg-doped GaN studied using a monoenergetic positron beam

Title
Defect characterization in Mg-doped GaN studied using a monoenergetic positron beam
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 111, Issue 1, Pages 014508
Publisher
AIP Publishing
Online
2012-01-10
DOI
10.1063/1.3675516

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