Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf 0.5 Zr 0.5 O 2 Capacitors
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Title
Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf
0.5
Zr
0.5
O
2
Capacitors
Authors
Keywords
-
Journal
Advanced Materials Interfaces
Volume -, Issue -, Pages 1901180
Publisher
Wiley
Online
2019-09-06
DOI
10.1002/admi.201901180
References
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