A magnification-continuous calibration method for SEM-based nanorobotic manipulation systems

A robust rotation-invariance displacement measurement method for a micro-/nano-positioning system

(2018) Xiang Zhang et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Visual Servoing-Based Nanorobotic System for Automated Electrical Characterization of Nanotubes inside SEM

(2018) Huiyang Ding et al.   SENSORS

Calibration of a scanning electron microscope from two coordinates

(2017) Yu. A. Novikov   Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques

Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications

(2017) R. V. Kirtaev et al.   MEASUREMENT TECHNIQUES

Line-based calibration of a micro-vision motion measurement system

(2017) Hai Li et al.   OPTICS AND LASERS IN ENGINEERING

A high accuracy algorithm of displacement measurement for a micro-positioning stage

(2017) Xiang Zhang et al.   AIP Advances

A Framework to Calibrate the Scanning Electron Microscope Under Variational Magnifications

(2016) Xingjian Liu et al.   IEEE PHOTONICS TECHNOLOGY LETTERS

Mechatronic Development and Vision Feedback Control of a Nanorobotics Manipulation System inside SEM for Nanodevice Assembly

(2016) Zhan Yang et al.   SENSORS

Recent advances in nanorobotic manipulation inside scanning electron microscopes

(2016) Chaoyang Shi et al.   Microsystems & Nanoengineering

Automated Robotic Manipulation of Individual Colloidal Particles Using Vision-Based Control

(2015) Soren Zimmermann et al.   IEEE-ASME TRANSACTIONS ON MECHATRONICS

Dynamic Force Characterization Microscopy Based on Integrated Nanorobotic AFM and SEM System for Detachment Process Study

(2015) Yajing Shen et al.   IEEE-ASME TRANSACTIONS ON MECHATRONICS

Automated Mechanical Characterization of 2-D Materials using SEM based Visual Servoing

(2014) Sören Zimmermann et al.   International Journal of Optomechatronics

Magnification-continuous static calibration model of a scanning-electron microscope

(2013) Abed C. Malti et al.   JOURNAL OF ELECTRONIC IMAGING

Calibration of Smooth Camera Models

(2012) P. Miraldo et al.   IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE

Buckling Nanoneedle for Characterizing Single Cells Mechanics Inside Environmental SEM

(2009) Mohd Ridzuan Ahmad et al.   IEEE TRANSACTIONS ON NANOTECHNOLOGY

Calibrating a scanning electron microscope in two coordinates by the use of one certified dimension

(2008) Ch. P. Volk et al.   MEASUREMENT TECHNIQUES