Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
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Title
Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
Authors
Keywords
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Journal
Scientific Reports
Volume 7, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-07-03
DOI
10.1038/s41598-017-05010-y
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