Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
出版年份 2017 全文链接
标题
Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
作者
关键词
-
出版物
Scientific Reports
Volume 7, Issue 1, Pages -
出版商
Springer Nature
发表日期
2017-07-03
DOI
10.1038/s41598-017-05010-y
参考文献
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