Two-bit-per-cell resistive switching memory device with a Ti/MgZnO/Pt structure

High Responsivity MgxZn1−xO Film UV Photodetector Grown by RF Sputtering

(2015) Jyun-Yi Li et al.   IEEE PHOTONICS TECHNOLOGY LETTERS

UV photocurrent responses of ZnO and MgZnO/ZnO processed by atmospheric pressure plasma jets

(2015) Tsung-Han Wu et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Bipolar Ni/ZnO/HfO2/Ni RRAM with multilevel characteristic by different reset bias

(2015) Wei-Kang Hsieh et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Forming-free and self-rectifying resistive switching of the simple Pt/TaOx/n-Si structure for access device-free high-density memory application

(2015) Shuang Gao et al.   Nanoscale

Tunable Multilevel Storage of Complementary Resistive Switching on Single-Step Formation of ZnO/ZnWOx Bilayer Structure via Interfacial Engineering

(2014) Shih-Ming Lin et al.   ACS Applied Materials & Interfaces

Motional Resistance Issue of TSV-Based Resonator Device and Its Improvement With a Concave Cu TSV Structural Design

(2014) Jian-Yu Shih et al.   IEEE ELECTRON DEVICE LETTERS

Complementary switching on TiN/MgZnO/ZnO/Pt bipolar memory devices for nanocrossbar arrays

(2014) Xinman Chen et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Recent progress in resistive random access memories: Materials, switching mechanisms, and performance

(2014) F. Pan et al.   MATERIALS SCIENCE & ENGINEERING R-REPORTS

Characteristics of tantalum-doped silicon oxide-based resistive random access memory

(2014) Wei-Kang Hsieh et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Self-compliance RRAM characteristics using a novel W/TaOx/TiN structure

(2014) Siddheswar Maikap et al.   Nanoscale Research Letters

Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors

(2013) Yaonan Hou et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Resistive switching characteristics of nickel silicide layer embedded HfO2 film

(2012) Debashis Panda et al.   APPLIED PHYSICS LETTERS

Dynamic Processes of Resistive Switching in Metallic Filament-Based Organic Memory Devices

(2012) Shuang Gao et al.   Journal of Physical Chemistry C

Metal–Oxide RRAM

(2012) H.-S. Philip Wong et al.   PROCEEDINGS OF THE IEEE

Investigation on interface related charge trap and loss characteristics of high-k based trapping structures by electrostatic force microscopy

(2011) Chenxin Zhu et al.   APPLIED PHYSICS LETTERS

Compact Modeling of Conducting-Bridge Random-Access Memory (CBRAM)

(2011) Shimeng Yu et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

A study of cycling induced degradation mechanisms in Si nanocrystal memory devices

(2011) Dandan Jiang et al.   NANOTECHNOLOGY

Influence of Crystalline Constituent on Resistive Switching Properties of TiO[sub 2] Memory Films

(2009) Wen-Yuan Chang et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Resistive Switching Characteristics of Sol–Gel Zinc Oxide Films for Flexible Memory Applications

(2009) Sungho Kim et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES