Self-compliance RRAM characteristics using a novel W/TaOx/TiN structure

Title
Self-compliance RRAM characteristics using a novel W/TaOx/TiN structure
Authors
Keywords
RRAM, Self-compliance, Resistive switching, TaO<sub><em class=EmphasisTypeItalic >x</em></sub>, Non-linearity
Journal
Nanoscale Research Letters
Volume 9, Issue 1, Pages 292
Publisher
Springer Nature
Online
2014-06-10
DOI
10.1186/1556-276x-9-292

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