Optimal design of the multiple-apertures-GaN-based vertical HEMTs with $$\hbox {SiO}_{2}$$ SiO 2 current blocking layer

Title
Optimal design of the multiple-apertures-GaN-based vertical HEMTs with $$\hbox {SiO}_{2}$$ SiO 2 current blocking layer
Authors
Keywords
Vertical high electron mobility transistor, Silicon dioxide current blocking layer, Multiple apertures, Electrical characteristic, Breakdown voltage, Simulation
Journal
Journal of Computational Electronics
Volume 15, Issue 1, Pages 154-162
Publisher
Springer Nature
Online
2015-08-06
DOI
10.1007/s10825-015-0738-5

Ask authors/readers for more resources

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started