Optimal design of the multiple-apertures-GaN-based vertical HEMTs with $$\hbox {SiO}_{2}$$ SiO 2 current blocking layer

标题
Optimal design of the multiple-apertures-GaN-based vertical HEMTs with $$\hbox {SiO}_{2}$$ SiO 2 current blocking layer
作者
关键词
Vertical high electron mobility transistor, Silicon dioxide current blocking layer, Multiple apertures, Electrical characteristic, Breakdown voltage, Simulation
出版物
Journal of Computational Electronics
Volume 15, Issue 1, Pages 154-162
出版商
Springer Nature
发表日期
2015-08-06
DOI
10.1007/s10825-015-0738-5

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