Multi-level control of conductive nano-filament evolution in HfO2 ReRAM by pulse-train operations
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Title
Multi-level control of conductive nano-filament evolution in HfO2 ReRAM by pulse-train operations
Authors
Keywords
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Journal
Nanoscale
Volume 6, Issue 11, Pages 5698-5702
Publisher
Royal Society of Chemistry (RSC)
Online
2014-03-26
DOI
10.1039/c4nr00500g
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- (2012) H.-S. Philip Wong et al. PROCEEDINGS OF THE IEEE
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- (2011) B. Chen et al. IEEE ELECTRON DEVICE LETTERS
- Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth
- (2011) Daniele Ielmini IEEE TRANSACTIONS ON ELECTRON DEVICES
- Metal oxide resistive memory switching mechanism based on conductive filament properties
- (2011) G. Bersuker et al. JOURNAL OF APPLIED PHYSICS
- Nanofilamentary resistive switching in binary oxide system; a review on the present status and outlook
- (2011) Kyung Min Kim et al. NANOTECHNOLOGY
- Resistance Controllability of $\hbox{Ta}_{2} \hbox{O}_{5}/\hbox{TiO}_{2}$ Stack ReRAM for Low-Voltage and Multilevel Operation
- (2010) M. Terai et al. IEEE ELECTRON DEVICE LETTERS
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- (2010) Deok-Hwang Kwon et al. Nature Nanotechnology
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- (2008) Yong-Mu Kim et al. JOURNAL OF APPLIED PHYSICS
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