Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices

Authors

Keywords

Journal

Volume 56, Issue 2, Pages 193-200

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2009-01-29

DOI

10.1109/ted.2008.2010584

Explore over 38,000 international journals covering a vast array of academic fields.

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now