Redeposition in plasma-assisted atomic layer deposition: Silicon nitride film quality ruled by the gas residence time

Title
Redeposition in plasma-assisted atomic layer deposition: Silicon nitride film quality ruled by the gas residence time
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 107, Issue 1, Pages 014102
Publisher
AIP Publishing
Online
2015-07-08
DOI
10.1063/1.4926366

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