Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction

Title
Non-destructive assessment of the polarity of GaN nanowire ensembles using low-energy electron diffraction and x-ray photoelectron diffraction
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 2, Pages 021602
Publisher
AIP Publishing
Online
2015-01-13
DOI
10.1063/1.4905651

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