Intrinsic SiOx-based unipolar resistive switching memory. I. Oxide stoichiometry effects on reversible switching and program window optimization
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Title
Intrinsic SiOx-based unipolar resistive switching memory. I. Oxide stoichiometry effects on reversible switching and program window optimization
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 4, Pages 043708
Publisher
AIP Publishing
Online
2014-07-29
DOI
10.1063/1.4891242
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