Intrinsic SiOx-based unipolar resistive switching memory. II. Thermal effects on charge transport and characterization of multilevel programing
Published 2014 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Intrinsic SiOx-based unipolar resistive switching memory. II. Thermal effects on charge transport and characterization of multilevel programing
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 4, Pages 043709
Publisher
AIP Publishing
Online
2014-07-29
DOI
10.1063/1.4891244
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Intrinsic SiOx-based unipolar resistive switching memory. I. Oxide stoichiometry effects on reversible switching and program window optimization
- (2014) Yao-Feng Chang et al. JOURNAL OF APPLIED PHYSICS
- HfOx-Based Vertical Resistive Switching Random Access Memory Suitable for Bit-Cost-Effective Three-Dimensional Cross-Point Architecture
- (2013) Shimeng Yu et al. ACS Nano
- Tunable Electroluminescence in Planar Graphene/SiO2Memristors
- (2013) Congli He et al. ADVANCED MATERIALS
- Effects of sidewall etching on electrical properties of SiOx resistive random access memory
- (2013) Yanzhen Wang et al. APPLIED PHYSICS LETTERS
- Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
- (2013) Tian-Jian Chu et al. IEEE ELECTRON DEVICE LETTERS
- Analysis of Charge-Pumping Data for Identification of Dielectric Defects
- (2013) Dmitry Veksler et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Integrated One Diode–One Resistor Architecture in Nanopillar SiOx Resistive Switching Memory by Nanosphere Lithography
- (2013) Li Ji et al. NANO LETTERS
- Reduced Electroforming Voltage and Enhanced Programming Stability in Resistive Switching of SiO2 Thin Films
- (2013) Y.-T. Chen et al. ECS Solid State Letters
- Effect of hydrogen/deuterium incorporation on electroforming voltage of SiOx resistive random access memory
- (2012) Yanzhen Wang et al. APPLIED PHYSICS LETTERS
- Study of polarity effect in SiOx-based resistive switching memory
- (2012) Yao-Feng Chang et al. APPLIED PHYSICS LETTERS
- Tristate Operation in Resistive Switching of $ \hbox{SiO}_{2}$ Thin Films
- (2012) Yen-Ting Chen et al. IEEE ELECTRON DEVICE LETTERS
- Understanding the resistive switching characteristics and mechanism in active SiOx-based resistive switching memory
- (2012) Yao-Feng Chang et al. JOURNAL OF APPLIED PHYSICS
- Resistive switching in silicon suboxide films
- (2012) Adnan Mehonic et al. JOURNAL OF APPLIED PHYSICS
- Electrically tailored resistance switching in silicon oxide
- (2012) Adnan Mehonic et al. NANOTECHNOLOGY
- In situ imaging of the conducting filament in a silicon oxide resistive switch
- (2012) Jun Yao et al. Scientific Reports
- Investigation statistics of bipolar multilevel memristive mechanism and characterizations in a thin FeOx transition layer of TiN/SiO2/FeOx/Fe structure
- (2011) Yao-Feng Chang et al. JOURNAL OF APPLIED PHYSICS
- Metal oxide resistive memory switching mechanism based on conductive filament properties
- (2011) G. Bersuker et al. JOURNAL OF APPLIED PHYSICS
- A fast, high-endurance and scalable non-volatile memory device made from asymmetric Ta2O5−x/TaO2−x bilayer structures
- (2011) Myoung-Jae Lee et al. NATURE MATERIALS
- A Unified Hopping Model for Subthreshold Current of Phase-Change Memories in Amorphous State
- (2010) Alessandro Calderoni et al. IEEE ELECTRON DEVICE LETTERS
- Multilevel resistive switching in Ti/CuxO/Pt memory devices
- (2010) Sheng-Yu Wang et al. JOURNAL OF APPLIED PHYSICS
- Reversible Resistive Switching and Multilevel Recording in La0.7Sr0.3MnO3Thin Films for Low Cost Nonvolatile Memories
- (2010) César Moreno et al. NANO LETTERS
- Resistive Switches and Memories from Silicon Oxide
- (2010) Jun Yao et al. NANO LETTERS
- Reproducible resistance switching of a relatively thin FeOx layer produced by oxidizing the surface of a FePt electrode in a metal-oxide–metal structure
- (2010) Li-Wei Feng et al. THIN SOLID FILMS
- Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices
- (2009) Ugo Russo et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Investigation of resistive switching in Cu-doped HfO2thin film for multilevel non-volatile memory applications
- (2009) Yan Wang et al. NANOTECHNOLOGY
- Role of structural defects in the unipolar resistive switching characteristics of Pt∕NiO∕Pt structures
- (2008) Chanwoo Park et al. APPLIED PHYSICS LETTERS
- Nonpolar Nonvolatile Resistive Switching in Cu Doped $\hbox{ZrO}_{2}$
- (2008) Weihua Guan et al. IEEE ELECTRON DEVICE LETTERS
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreDiscover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversation