Multi-scale quantum point contact model for filamentary conduction in resistive random access memories devices
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Title
Multi-scale quantum point contact model for filamentary conduction in resistive random access memories devices
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 115, Issue 24, Pages 244507
Publisher
AIP Publishing
Online
2014-06-26
DOI
10.1063/1.4885419
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