Strain analysis in SiN/Ge microstructures obtained via Si-complementary metal oxide semiconductor compatible approach
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Title
Strain analysis in SiN/Ge microstructures obtained via Si-complementary metal oxide semiconductor compatible approach
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 113, Issue 1, Pages 013513
Publisher
AIP Publishing
Online
2013-01-05
DOI
10.1063/1.4772781
References
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Related references
Note: Only part of the references are listed.- Control of tensile strain in germanium waveguides through silicon nitride layers
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- A micromachining-based technology for enhancing germanium light emission via tensile strain
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- An electrically pumped germanium laser
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- Direct-Gap Gain and Optical Absorption in Germanium Correlated to the Density of Photoexcited Carriers, Doping, and Strain
- (2012) Lee Carroll et al. PHYSICAL REVIEW LETTERS
- Composition and strain in thin Si1−xGex virtual substrates measured by micro-Raman spectroscopy and x-ray diffraction
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- Optical gain in single tensile-strained germanium photonic wire
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- Strained germanium thin film membrane on silicon substrate for optoelectronics
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- Direct-bandgap light-emitting germanium in tensilely strained nanomembranes
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- Low threading dislocation density Ge deposited on Si (100) using RPCVD
- (2011) Yuji Yamamoto et al. SOLID-STATE ELECTRONICS
- Control of direct band gap emission of bulk germanium by mechanical tensile strain
- (2010) M. El Kurdi et al. APPLIED PHYSICS LETTERS
- Band structure and optical gain of tensile-strained germanium based on a 30 band k⋅p formalism
- (2010) Moustafa El Kurdi et al. JOURNAL OF APPLIED PHYSICS
- Recent progress in lasers on silicon
- (2010) Di Liang et al. Nature Photonics
- Ge-on-Si laser operating at room temperature
- (2010) Jifeng Liu et al. OPTICS LETTERS
- Toward a Germanium Laser for Integrated Silicon Photonics
- (2009) Xiaochen Sun et al. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
- Enhanced direct bandgap emission in germanium by micromechanical strain engineering
- (2009) Peng Huei Lim et al. OPTICS EXPRESS
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