Composition and strain in thin Si1−xGex virtual substrates measured by micro-Raman spectroscopy and x-ray diffraction

Strain in epitaxial Si/SiGe graded buffer structures grown on Si(100), Si(110), and Si(111) optically evaluated by polarized Raman spectroscopy and imaging

(2010) M. Mermoux et al.   JOURNAL OF APPLIED PHYSICS

Structural properties of tensily strained Si layers grown on SiGe(100), (110), and (111) virtual substrates

(2009) V. Destefanis et al.   JOURNAL OF APPLIED PHYSICS

SiGe nanostructures

(2009) I. Berbezier et al.   SURFACE SCIENCE REPORTS

Raman spectroscopy determination of composition and strain in heterostructures

(2008) F. Pezzoli et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

MBE growth of Ge/Si quantum dots upon low-energy pulsed ion irradiation

(2008) N.P. Stepina et al.   THIN SOLID FILMS

Germanium waveguide photodetectors integrated on silicon with MBE

(2008) M. Oehme et al.   THIN SOLID FILMS