Resistive Switching Behavior of Partially Anodized Aluminum Thin Film at Elevated Temperatures

Ultralow Switching Energy Ni/$\hbox{GeO}_{x}$/HfON/TaN RRAM

(2011) C. H. Cheng et al.   IEEE ELECTRON DEVICE LETTERS

Modeling of Retention Failure Behavior in Bipolar Oxide-Based Resistive Switching Memory

(2011) Bin Gao et al.   IEEE ELECTRON DEVICE LETTERS

Temperature Dependence of Resistive Switching in Aluminum/Anodized Aluminum Film Structure

(2011) W. Zhu et al.   Nanoscience and Nanotechnology Letters

Effects of Ultrathin Al Layer Insertion on Resistive Switching Performance in an Amorphous Aluminum Oxide Resistive Memory

(2010) Jaehoon Song et al.   Applied Physics Express

Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model

(2010) Kyung Min Kim et al.   APPLIED PHYSICS LETTERS

Temperature Instability of Resistive Switching on $ \hbox{HfO}_{x}$-Based RRAM Devices

(2010) Z Fang et al.   IEEE ELECTRON DEVICE LETTERS

Investigation of State Stability of Low-Resistance State in Resistive Memory

(2010) Jubong Park et al.   IEEE ELECTRON DEVICE LETTERS

$\hbox{Al}_{2}\hbox{O}_{3}$-Based RRAM Using Atomic Layer Deposition (ALD) With 1-$\mu\hbox{A}$ RESET Current

(2010) Yi Wu et al.   IEEE ELECTRON DEVICE LETTERS

Coexistence of unipolar and bipolar resistive switching characteristics in ZnO thin films

(2010) Seunghyup Lee et al.   JOURNAL OF APPLIED PHYSICS

Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices

(2009) Ugo Russo et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Nonpolar Resistance Switching in Anodic Oxide Alumina Films

(2009) Vadim Sh. Yalishev et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Resistive switching in aluminum/anodized aluminum film structure without forming process

(2009) W. Zhu et al.   JOURNAL OF APPLIED PHYSICS

Resistive switching of aluminum oxide for flexible memory

(2008) Sungho Kim et al.   APPLIED PHYSICS LETTERS

Improvement of Resistive Switching in $\hbox{Cu}_{x} \hbox{O}$ Using New RESET Mode

(2008) M. Yin et al.   IEEE ELECTRON DEVICE LETTERS

Temperature dependence of voltage-controlled negative resistance and electroluminescence in Al–Al2O3–Au diodes

(2008) T. W. Hickmott   JOURNAL OF APPLIED PHYSICS