Temperature Instability of Resistive Switching on $ \hbox{HfO}_{x}$-Based RRAM Devices

Title
Temperature Instability of Resistive Switching on $ \hbox{HfO}_{x}$-Based RRAM Devices
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 31, Issue 5, Pages 476-478
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-03-17
DOI
10.1109/led.2010.2041893

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