Modeling of Retention Failure Behavior in Bipolar Oxide-Based Resistive Switching Memory

Title
Modeling of Retention Failure Behavior in Bipolar Oxide-Based Resistive Switching Memory
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 32, Issue 3, Pages 276-278
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-02-04
DOI
10.1109/led.2010.2102002

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