Review paper: Transparent amorphous oxide semiconductor thin film transistor

Carrier-suppressing effect of scandium in InZnO systems for solution-processed thin film transistors

(2010) Yuri Choi et al.   APPLIED PHYSICS LETTERS

Role of silicon in silicon-indium-zinc-oxide thin-film transistor

(2010) Eugene Chong et al.   APPLIED PHYSICS LETTERS

The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress

(2010) Ji Sim Jung et al.   APPLIED PHYSICS LETTERS

Effect of Zr addition on ZnSnO thin-film transistors using a solution process

(2010) You Seung Rim et al.   APPLIED PHYSICS LETTERS

The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor

(2010) Jang-Yeon Kwon et al.   APPLIED PHYSICS LETTERS

The influence of SiOx and SiNx passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

(2010) Joon Seok Park et al.   APPLIED PHYSICS LETTERS

Investigation of the effects of Mg incorporation into InZnO for high-performance and high-stability solution-processed thin film transistors

(2010) Gun Hee Kim et al.   APPLIED PHYSICS LETTERS

The effect of La in InZnO systems for solution-processed amorphous oxide thin-film transistors

(2010) Doo Na Kim et al.   APPLIED PHYSICS LETTERS

The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors

(2010) Jang-Yeon Kwon et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

The Effect of Passivation Layers on the Negative Bias Instability of Ga–In–Zn–O Thin Film Transistors under Illumination

(2010) Ji Sim Jung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Highly Stable Double-Gate Ga–In–Zn–O Thin-Film Transistor

(2010) Kyoung-Seok Son et al.   IEEE ELECTRON DEVICE LETTERS

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

(2010) Kwang Hwan Ji et al.   IEEE ELECTRON DEVICE LETTERS

Low-temperature, high-performance solution-processed metal oxide thin-film transistors formed by a ‘sol–gel on chip’ process

(2010) K. K. Banger et al.   NATURE MATERIALS

Impact of high-k TiOx dielectric on device performance of indium-gallium-zinc oxide transistors

(2009) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Charge pumping method for photosensor application by using amorphous indium-zinc oxide thin film transistors

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Gate-bias stress in amorphous oxide semiconductors thin-film transistors

(2009) M. E. Lopes et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

(2009) Chang-Jung Kim et al.   APPLIED PHYSICS LETTERS

Reliable Bottom Gate Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors with TiO[sub x] Passivation Layer

(2009) Hyun-Sik Seo et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

A Low Operating Voltage ZnO Thin Film Transistor Using a High-κ HfLaO Gate Dielectric

(2009) N. C. Su et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

(2009) Ken Hoshino et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Ring-Edged Bank Array Made by Inkjet Printing for Color Filters

(2009) Jhih-Ping Lu et al.   Journal of Display Technology

Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors

(2009) Tze-Ching Fung et al.   Journal of Display Technology

High performance solution-processed amorphous zinc tin oxide thin film transistor

(2009) Seok-Jun Seo et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Copper source/drain electrode contact resistance effects in amorphous indium-gallium-zinc-oxide thin film transistors

(2009) Woong-Sun Kim et al.   Physica Status Solidi-Rapid Research Letters

Stability of thin film transistors incorporating a zinc oxide or indium zinc oxide channel deposited by a high rate sputtering process

(2009) A J Flewitt et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

The Remarkable Thermal Stability of Amorphous In-Zn-O Transparent Conductors

(2008) Matthew P. Taylor et al.   ADVANCED FUNCTIONAL MATERIALS

Novel ZrInZnO Thin-film Transistor with Excellent Stability

(2008) Jin-Seong Park et al.   ADVANCED MATERIALS

Transparent and Photo-stable ZnO Thin-film Transistors to Drive an Active Matrix Organic-Light- Emitting-Diode Display Panel

(2008) Sang-Hee K. Park et al.   ADVANCED MATERIALS

Impact of aluminum nitride as an insulator on the performance of zinc oxide thin film transistors

(2008) M. M. De Souza et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

High performance indium gallium zinc oxide thin film transistors fabricated on polyethylene terephthalate substrates

(2008) Wantae Lim et al.   APPLIED PHYSICS LETTERS

Transparent Al–Zn–Sn–O thin film transistors prepared at low temperature

(2008) Doo-Hee Cho et al.   APPLIED PHYSICS LETTERS

High-performance InGaZnO thin-film transistors with high-k amorphous Ba0.5Sr0.5TiO3 gate insulator

(2008) J. B. Kim et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Threshold Voltage Control of Amorphous Gallium Indium Zinc Oxide TFTs by Suppressing Back-Channel Current

(2008) Kyoung-Seok Son et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display

(2008) Jang Yeon Kwon et al.   IEEE ELECTRON DEVICE LETTERS

Program/Erase Characteristics of Amorphous Gallium Indium Zinc Oxide Nonvolatile Memory

(2008) Huaxiang Yin et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Thermal Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors

(2008) Mami Fujii et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Improving the Gate Stability of ZnO Thin-Film Transistors with Aluminum Oxide Dielectric Layers

(2008) Min Suk Oh et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Zn-In-O based thin-film transistors: Compositional dependence

(2008) N. Itagaki et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Specific contact resistances between amorphous oxide semiconductor In–Ga–Zn–O and metallic electrodes

(2007) Yasuhiro Shimura et al.   THIN SOLID FILMS