The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

标题
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
作者
关键词
-
出版物
AIP Advances
Volume 3, Issue 8, Pages 082107
出版商
AIP Publishing
发表日期
2013-08-07
DOI
10.1063/1.4818119

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