The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Permanent optical doping of amorphous metal oxide semiconductors by deep ultraviolet irradiation at room temperature

(2010) Hyungtak Seo et al.   APPLIED PHYSICS LETTERS

The influence of SiOx and SiNx passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination

(2010) Joon Seok Park et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

(2009) Chang-Jung Kim et al.   APPLIED PHYSICS LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Transparent and Photo-stable ZnO Thin-film Transistors to Drive an Active Matrix Organic-Light- Emitting-Diode Display Panel

(2008) Sang-Hee K. Park et al.   ADVANCED MATERIALS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Origin of Subthreshold Swing Improvement in Amorphous Indium Gallium Zinc Oxide Transistors

(2008) Jong Han Jeong et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS