Combustion-process derived comparable performances of Zn-(In:Sn)-O thin-film transistors with a complete miscibility

Instability Induced by Ultraviolet Light in ZnO Thin-Film Transistors

(2014) Ping Wu et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

UV-Visible Spectroscopic Analysis of Electrical Properties in Alkali Metal-Doped Amorphous Zinc Tin Oxide Thin-Film Transistors

(2013) Keon-Hee Lim et al.   ADVANCED MATERIALS

Characterization of amorphous Si-Zn-Sn-O thin films and applications in thin-film transistors

(2013) Chuanjia Wu et al.   APPLIED PHYSICS LETTERS

Oxygen “Getter” Effects on Microstructure and Carrier Transport in Low Temperature Combustion-Processed a-InXZnO (X = Ga, Sc, Y, La) Transistors

(2013) Jonathan W. Hennek et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Water assisted oxygen absorption on the instability of amorphous InAlZnO thin-film transistors

(2013) Jie Zhang et al.   RSC Advances

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Performance and stability of amorphous InGaZnO thin film transistors with a designed device structure

(2011) J. Zhang et al.   JOURNAL OF APPLIED PHYSICS

Low-temperature fabrication of high-performance metal oxide thin-film electronics via combustion processing

(2011) Myung-Gil Kim et al.   NATURE MATERIALS

Effect of Zr addition on ZnSnO thin-film transistors using a solution process

(2010) You Seung Rim et al.   APPLIED PHYSICS LETTERS

High-Performance Solution-Processed Amorphous Zinc−Indium−Tin Oxide Thin-Film Transistors

(2010) Myung-Gil Kim et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS