Band alignment of HfO2/Al0.25Ga0.75N determined by x-ray photoelectron spectroscopy: Effect of SiH4 surface treatment

Title
Band alignment of HfO2/Al0.25Ga0.75N determined by x-ray photoelectron spectroscopy: Effect of SiH4 surface treatment
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 9, Pages 091605
Publisher
AIP Publishing
Online
2014-03-06
DOI
10.1063/1.4867878

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